A Test Generation Method Based on k-Cycle Testing for Finite State Machines. - Yuya Kinoshita; Toshinori Hosokawa; Hideo Fujiwara (IOLTS, 2019)

Development of FF Circuits for Measures Against Power Supply Noise. - Yukiya Miura; Miyuki Inoue; Yuya Kinoshita (IOLTS, 2019)

Soft Error Tolerance of Power-Supply-Noise Hardened Latches. - Yukiya Miura; Yuya Kinoshita (IOLTS, 2020)