X-Masking During Logic BIST and Its Impact on Defect Coverage. - Yuyi Tang; Hans-Joachim Wunderlich; Harald P. E. Vranken; Friedrich Hapke; Michael Wittke; Piet Engelke; Ilia Polian; Bernd Becker 001 (ITC, 2004)

X-masking during logic BIST and its impact on defect coverage. - Yuyi Tang; Hans-Joachim Wunderlich; Piet Engelke; Ilia Polian; Bernd Becker 001; Jürgen Schlöffel; Friedrich Hapke; Michael Wittke (IEEE Trans. Very Large Scale Integr. Syst., 2006)