Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. - Kan Takeuchi; Atsushi Yoshikawa 003; Michio Komoda; Ken Kotani; Hiroaki Matsushita; Yusaku Katsuki; YuyoYamamoto; Takao Sato (IEEE Trans. Very Large Scale Integr. Syst., 2008)