Generation of yield-embedded Pareto-front for simultaneous optimization of yield and performances. - Yu Liu; Masato Yoshioka; Katsumi Homma; Toshiyuki Shibuya; Yuzi Kanazawa (DAC, 2010)

Speed-path analysis for multi-path failed latches with random variation. - Tsutomu Ishida; Izumi Nitta; Katsumi Homma; Yuzi Kanazawa; Hiroaki Komatsu (ISQED, 2012)

A volume diagnosis method for identifying systematic faults in lower-yield wafer occurring during mass production. - Tsutomu Ishida; Izumi Nitta; Koji Banno; Yuzi Kanazawa (ASP-DAC, 2014)

Deep Learning-Based Wafer-Map Failure Pattern Recognition Framework. - Tsutomu Ishida; Izumi Nitta; Daisuke Fukuda; Yuzi Kanazawa (ISQED, 2019)

Online Self-Supervised Learning for Object Picking: Detecting Optimum Grasping Position using a Metric Learning Approach. - Kanata Suzuki; Yasuto Yokota; Yuzi Kanazawa; Tomoyoshi Takebayashi (SII, 2020)

A Multi-task Learning Framework for Grasping-Position Detection and Few-Shot Classification. - Yasuto Yokota; Kanata Suzuki; Yuzi Kanazawa; Tomoyoshi Takebayashi (SII, 2020)