An Improved CMOS BICS for On-Line Testing. - Yvan Maidon; Yann Deval; Jean-Baptiste Bégueret (IOLTW, 2000)

A New Laser System for X-Rays Flashes Sensitivity Evaluation. - Dean Lewis; Hervé Lapuyade; Yann Deval; Yvan Maidon; Frédéric Darracq; Renaud Briand; Pascal Fouillat (IOLTW, 2001)

An Analog Circuit Fault Characterization Methodology. - Yvan Maidon; Thomas Zimmer; André Ivanov (J. Electron. Test., 2005)