A World-Wide-Web based instrumentation pool real testing in a virtual world. - Thomas Zimmer; Patrice Kadionik; Yves Danto (MSE, 1997)

Behavioral Modeling of Analogue and Mixed Integrated Systems with VHDL-AMS for RF Applications. - Ahmed Fakhfakh; Hervé Levi; Noëlle Milet-Lewis; Yves Danto (SBCCI, 2002)

Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). - Jean Augereau; Yves Ousten; Laurent Béchou; Yves Danto (Microelectron. Reliab., 2002)

High temperature reliability testing of aluminum and tantalum electrolytic capacitors. - A. Dehbi; Wolfgang Wondrak; Yves Ousten; Yves Danto (Microelectron. Reliab., 2002)

Evaluation of a micropackaging analysis technique by highfrequency microwaves. - Geneviève Duchamp; Yves Ousten; Yves Danto (Microelectron. Reliab., 2002)

Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language. - B. Mongellaz; François Marc; Noëlle Milet-Lewis; Yves Danto (Microelectron. Reliab., 2002)

Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. - B. Trégon; Yves Ousten; Yves Danto; Laurent Béchou; Bernard Parmentier (Microelectron. Reliab., 2002)

Reliability simulation of electronic circuits with VHDL-AMS. - François Marc; B. Mongellaz; Yves Danto (FDL, 2003)

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. - G. Andriamonje; Vincent Pouget; Yves Ousten; Dean Lewis; Yves Danto; Jean-Michel Rampnoux; Younès Ezzahri; Stefan Dilhaire; Stéphane Grauby; Wilfrid Claeys (Microelectron. Reliab., 2003)

A physical approach on SCOBIC investigation in VLSI. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Philippe Perdu; Pascal Fouillat; Yves Danto (Microelectron. Reliab., 2003)

Simulation of time depending void formation in copper, aluminum and tungsten plugged via structures. - David Dalleau; Kirsten Weide-Zaage; Yves Danto (Microelectron. Reliab., 2003)

Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. - Jean-Yves Delétage; F. J.-M. Verdier; Bernard Plano; Yannick Deshayes; Laurent Béchou; Yves Danto (Microelectron. Reliab., 2003)

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. - Yannick Deshayes; Laurent Béchou; Jean-Yves Delétage; Frédéric Verdier; Yves Danto; Dominique Laffitte; Jean-Luc Goudard (Microelectron. Reliab., 2003)

Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. - Laurent Mendizabal; Jean-Louis Verneuil; Laurent Béchou; Christelle Aupetit-Berthelemot; Yannick Deshayes; Frédéric Verdier; Jean-Michel Dumas; Yves Danto; Dominique Laffitte; Jean-Luc Goudard (Microelectron. Reliab., 2003)

Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. - B. Mongellaz; François Marc; Yves Danto (Microelectron. Reliab., 2003)

Moisture diffusion in BCB resins used for MEMS packaging. - Angie Tetelin; Claude Pellet; Jean-Yves Delétage; B. Carbonne; Yves Danto (Microelectron. Reliab., 2003)

An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. - Laurent Béchou; Dominique Dallet; Yves Danto; Pasquale Daponte; Yves Ousten; Sergio Rapuano (IEEE Trans. Instrum. Meas., 2003)

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. - Geneviève Duchamp; Frédéric Verdier; Yannick Deshayes; François Marc; Yves Ousten; Yves Danto (Microelectron. Reliab., 2004)

How to study delamination in plastic encapsulated devices. - Hélène Frémont; Jean-Yves Delétage; Kirsten Weide-Zaage; Yves Danto (Microelectron. Reliab., 2004)

Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. - Laurent Mendizabal; Laurent Béchou; Yannick Deshayes; Frédéric Verdier; Yves Danto; Dominique Laffitte; Jean-Luc Goudard; F. Houé (Microelectron. Reliab., 2004)

Vibration lifetime modelling of PCB assemblies using steinberg model. - A. Dehbi; Yves Ousten; Yves Danto; Wolfgang Wondrak (Microelectron. Reliab., 2005)

Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. - S. Huyghe; Laurent Béchou; Nicolas Zerounian; Yannick Deshayes; Frédéric Aniel; A. Denolle; Dominique Laffitte; Jean-Luc Goudard; Yves Danto (Microelectron. Reliab., 2005)

Multi-level Modeling of Hot Carrier Injection for Reliability. - Corinne Bestory; François Marc; Hervé Levi; Yves Danto (FDL, 2006)

Improved physical understanding of intermittent failure in continuous monitoring method. - W. C. Maia Filho; M. Brizoux; Hélène Frémont; Yves Danto (Microelectron. Reliab., 2006)

Torsion test applied for reballing and solder paste volume evaluation. - W. C. Maia Filho; M. Brizoux; Hélène Frémont; Yves Danto (Microelectron. Reliab., 2007)

Dynamic void formation in a DD-copper-structure with different metallization geometry. - Kirsten Weide-Zaage; David Dalleau; Yves Danto; Hélène Frémont (Microelectron. Reliab., 2007)