Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies. - D. Singh; Oscar D. Restrepo; P. P. Manik; N. Rao Mavilla; H. Zhang; Peter C. Paliwoda; S. Pinkett; Y. Deng; Eduardo Cruz Silva; Jeffrey B. Johnson; M. Bajaj; S. Furkay; et al. (IRPS, 2018)

Microprocessor Switching Activity Translation to AC Gate Oxide Wearout: Does it Matter? INTEL4 Meteor Lake Chip Activity Case Study. - Luigi Pantisano; K. Joshi; Z. Chbili; E. Frantz; S. M. Ramey; J. Hicks; H. Le; K. M. Foley; K. Pasumarthi; J. Sebot (IRPS, 2025)