An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. - Md. Altaf-Ul-Amin; Zahari Mohamed Darus (Asian Test Symposium, 1998)

VHDL Design of a Test Processor Based on Mixed-Mode Test Generation. - Md. Altaf-Ul-Amin; Zahari Mohamed Darus (Great Lakes Symposium on VLSI, 1999)