An accurate novel gate-sizing metric to optimize circuit performance under local intra-die process variations. - Zahira Perez; Hector Villacorta; Víctor H. Champac (VLSI-SoC, 2018)

Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells. - Zahira Perez; Javier Mesalles; Hector Villacorta; Fabian Vargas 001; Víctor H. Champac (LATS, 2020)