Variation-Aware Defect Characterization at Cell Level. - Zahra Paria Najafi-Haghi; Marzieh Hashemipour-Nazari; Hans-Joachim Wunderlich (ETS, 2020)

Resistive Open Defect Classification of Embedded Cells under Variations. - Zahra Paria Najafi-Haghi; Hans-Joachim Wunderlich (LATS, 2021)

Intelligent Methods for Test and Reliability. - Hussam Amrouch; Jens Anders; Steffen Becker 001; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; et al. (DATE, 2022)

On Extracting Reliability Information from Speed Binning. - Zahra Paria Najafi-Haghi; Florian Klemme; Hussam Amrouch; Hans-Joachim Wunderlich (ETS, 2022)

Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning. - Yiwen Liao; Zahra Paria Najafi-Haghi; Hans-Joachim Wunderlich; Bin Yang 009 (ITC, 2022)

Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. - Zahra Paria Najafi-Haghi; Florian Klemme; Hanieh Jafarzadeh; Hussam Amrouch; Hans-Joachim Wunderlich (DATE, 2023)

Robust Pattern Generation for Small Delay Faults Under Process Variations. - Hanieh Jafarzadeh; Florian Klemme; Jan Dennis Reimer; Zahra Paria Najafi-Haghi; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (ITC, 2023)

Test Aspects of System Health State Monitoring. - Hans-Joachim Wunderlich; Hanieh Jafarzadeh; Alexandra Kourfali; Natalia Lylina; Zahra Paria Najafi-Haghi (LATS, 2023)

Identifying Resistive Open Defects in Embedded Cells under Variations. - Zahra Paria Najafi-Haghi; Hans-Joachim Wunderlich (J. Electron. Test., 2023)