Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. - Mohd Fairuz Zakaria; Zainal Abu Kassim; Melanie Po-Leen Ooi; Serge N. Demidenko (Asian Test Symposium, 2005)

Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. - Mohd Fairuz Zakaria; Zainal Abu Kassim; Melanie Po-Leen Ooi; Serge N. Demidenko (IEEE Des. Test Comput., 2006)

Shortening Burn-In Test: Application of HVST and Weibull Statistical Analysis. - Melanie Po-Leen Ooi; Zainal Abu Kassim; Serge N. Demidenko (IEEE Trans. Instrum. Meas., 2007)