Ambient temperature and layout impact on self-heating characterization in FinFET devices. - Peter C. Paliwoda; Zakariae Chbili; A. Kerber; D. Singh; Durga Misra (IRPS, 2018)

Novel Oxide Top-Off Process Enabling Reliable PC-CA TDDB on IO Devices with Self Aligned Contact. - Tian Shen; Abu Naser Zainuddin; Purushothaman Srinivasan; Zakariae Chbili; Kai Zhao; Patrick Justison (IRPS, 2019)