The end-to-end chip surface defect segmentation method based on the diffusion model and attention mechanism. - Zilin Xia; Yufan Zhao; Jinan Gu; Wenbo Wang 012; Zedong Huang; Yan Gao; Peiyue Sun (Eng. Appl. Artif. Intell., 2025)

FC-DETR: High-precision end-to-end surface defect detector based on foreground supervision and cascade refined hybrid matching. - Zilin Xia; Yufan Zhao; Jinan Gu; Wenbo Wang; Wenhao Zhang; Zedong Huang (Expert Syst. Appl., 2025)

Surface Defect Detector Based on Deformable Convolution and Lightweight Multi-Scale Attention. - Zilin Xia; Zedong Huang; Jinan Gu; Wenbo Wang (Concurr. Comput. Pract. Exp., 2025)