ALRe: Outlier Detection for Guided Refinement. - Mingzhu Zhu; Zhang Gao; Junzhi Yu; Bingwei He; Jiantao Liu (ECCV (7), 2020)

A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD. - Mingzhu Zhu; Junzhi Yu; Zhang Gao; Bingwei He; Jiantao Liu (IEEE Signal Process. Lett., 2021)