Built-in self-test of molecular electronics-based nanofabrics. - Zhanglei Wang; Krishnendu Chakrabarty (ETS, 2005)

Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics. - Zhanglei Wang; Krishnendu Chakrabarty (ITC, 2005)

Test data compression for IP embedded cores using selective encoding of scan slices. - Zhanglei Wang; Krishnendu Chakrabarty (ITC, 2005)

Power-Aware Test Data Compression for Embedded IP Cores. - Nabil Badereddine; Zhanglei Wang; Patrick Girard 001; Krishnendu Chakrabarty; Serge Pravossoudovitch; Christian Landrault (ATS, 2006)

An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time. - Zhanglei Wang; Krishnendu Chakrabarty (ATS, 2006)

Test set enrichment using a probabilistic fault model and the theory of output deviations. - Zhanglei Wang; Krishnendu Chakrabarty; Michael Gössel (DATE, 2006)

SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. - Zhanglei Wang; Krishnendu Chakrabarty; Seongmoon Wang (DATE, 2007)

A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. - Zhanglei Wang; Krishnendu Chakrabarty; Michael Bienek (ETS, 2007)

A low cost test data compression technique for high n-detection fault coverage. - Seongmoon Wang; Zhanglei Wang; Wenlong Wei; Srimat T. Chakradhar (ITC, 2007)

Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. - Zhanglei Wang; Krishnendu Chakrabarty (J. Electron. Test., 2007)

Scan-BIST based on cluster analysis and the encoding of repeating sequences. - Lei Li 036; Zhanglei Wang; Krishnendu Chakrabarty (ACM Trans. Design Autom. Electr. Syst., 2007)

A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. - Nabil Badereddine; Zhanglei Wang; Patrick Girard 001; Krishnendu Chakrabarty; Arnaud Virazel; Serge Pravossoudovitch; Christian Landrault (J. Electron. Test., 2008)

Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns. - Zhanglei Wang; Krishnendu Chakrabarty (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Test Data Compression Using Selective Encoding of Scan Slices. - Zhanglei Wang; Krishnendu Chakrabarty (IEEE Trans. Very Large Scale Integr. Syst., 2008)

Physical defect modeling for fault insertion in system reliability test. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (ITC, 2009)

Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. - Zhanglei Wang; Krishnendu Chakrabarty; Seongmoon Wang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

Deviation-Based LFSR Reseeding for Test-Data Compression. - Zhanglei Wang; Hongxia Fang; Krishnendu Chakrabarty; Michael Bienek (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (Asian Test Symposium, 2010)

Board-level fault diagnosis using an error-flow dictionary. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (ITC, 2010)

Board-level fault diagnosis using Bayesian inference. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (VTS, 2010)

A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support. - Seongmoon Wang; Wenlong Wei; Zhanglei Wang (IEEE Trans. Very Large Scale Integr. Syst., 2010)

Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. - Zhaobo Zhang; Krishnendu Chakrabarty; Zhanglei Wang; Zhiyuan Wang; Xinli Gu (ITC, 2011)

Diagnostic system based on support-vector machines for board-level functional diagnosis. - Zhaobo Zhang; Xinli Gu; Yaohui Xie; Zhiyuan Wang; Zhanglei Wang; Krishnendu Chakrabarty (ETS, 2012)

Physical-Defect Modeling and Optimization for Fault-Insertion Test. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (IEEE Trans. Very Large Scale Integr. Syst., 2012)