A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model. - Jie Xiao 003; Jianhui Jiang; Xiaoxin Li; Yujiao Huang; Xuhua Yang 001; Zhanhui Shi; Jungang Lou (IEEE Access, 2018)

Circuit reliability prediction based on deep autoencoder network. - Jie Xiao 003; Weifeng Ma; Jungang Lou; Jianhui Jiang; Yujiao Huang; Zhanhui Shi; Qing Shen; Xuhua Yang 001 (Neurocomputing, 2019)

A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm. - Jie Xiao 003; Zhanhui Shi; Jianhui Jiang; Xu-Hua Yang 001; Yujiao Huang; Haigen Hu (J. Comput. Sci. Technol., 2019)

Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model. - Weidong Zhu; Jianhui Jiang; Zhanhui Shi (ATS, 2022)

BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks. - Jie Xiao 003; Zhanhui Shi; Xuhua Yang 001; Jungang Lou (IEEE Trans. Computers, 2022)

HTV: Measuring Circuit Vulnerability to Hardware Trojan Insertion Based on Node Co-activation Analysis. - Shuiliang Chai; Zhanhui Shi; Yanjiao Gao; Yuhao Huang; Aizhu Liu; Jie Xiao 003 (TrustCom, 2024)

A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits. - Zhanhui Shi; Jie Xiao 003; Weidong Zhu; Jianhui Jiang (IEEE Trans. Computers, 2024)

Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient. - Zhanhui Shi; Jie Xiao 003; Jianhui Jiang; Ying Zhang 040; Yuhao Zhou (IEEE Trans. Circuits Syst. II Express Briefs, 2024)

ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach. - Zhanhui Shi; Jie Xiao 003; Jianhui Jiang; Ying Zhang 040; Yuhao Zhou (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2024)

An Efficient Area and Reliability Optimization Method for MPRM Circuits Based on High-dimensional Genetic Algorithm. - Yuhao Zhou; Jianhui Jiang; Zhenxue He; Ying Zhang 040; Chengcheng Chen; Zhanhui Shi; Wei Zhang 248; Keying Yang (ACM Trans. Design Autom. Electr. Syst., 2025)