Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network. - Xian Tao; Wenzhi Ma; Zhenfeng Lu; Zhanxin Hou (IEEE Trans. Instrum. Meas., 2021)

Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Network. - Xian Tao; Dapeng Zhang; Wenzhi Ma; Zhanxin Hou; Zhenfeng Lu; Chandranath Adak (IEEE Trans. Ind. Informatics, 2022)