A novel analog-to-residue converter for biomedical DSP application. - Di Zhu 003; Qi Huang; Zhao Chuan Lee; Yuanjin Zheng; Liter Siek (ISOCC, 2012)

NBTI/PBTI-aware wordline voltage control with no boosted supply for stability improvement of half-selected SRAM cells. - Zhao Chuan Lee; Kim Ming Ho; Zhi-Hui Kong; Tony T. Kim (ISOCC, 2012)

NBTI/PBTI-Aware WWL Voltage Control for Half-Selected Cell Stability Improvement. - Zhao Chuan Lee; Kam Chew Leong; Zhi-Hui Kong; Tony Tae-Hyoung Kim (IEEE Trans. Circuits Syst. II Express Briefs, 2013)

0.2 V 8T SRAM with improved bitline sensing using column-based data randomization. - Anh-Tuan Do; Zhao Chuan Lee; Bo Wang 020; Ik-Joon Chang; Tony Tae-Hyoung Kim (A-SSCC, 2014)

0.77 fJ/bit/search Content Addressable Memory Using Small Match Line Swing and Automated Background Checking Scheme for Variation Tolerance. - Anh-Tuan Do; Chun Yin; Kavitha Velayudhan; Zhao Chuan Lee; Kiat Seng Yeo; Tony Tae-Hyoung Kim (IEEE J. Solid State Circuits, 2014)

An 8T SRAM with BTI-Aware Stability Monitor and two-phase write operation for cell stability improvement in 28-nm FDSOI. - Zhao Chuan Lee; M. Sultan M. Siddiqui; Zhi-Hui Kong; Tony Tae-Hyoung Kim (ESSCIRC, 2016)

0.2 V 8T SRAM With PVT-Aware Bitline Sensing and Column-Based Data Randomization. - Anh-Tuan Do; Zhao Chuan Lee; Bo Wang 020; Ik-Joon Chang; Xin Liu 015; Tony Tae-Hyoung Kim (IEEE J. Solid State Circuits, 2016)

A 16kb column-based split cell-VSS, data-aware write-assisted 9T ultra-low voltage SRAM with enhanced read sensing margin in 28nm FDSOI. - M. Sultan M. Siddiqui; Zhao Chuan Lee; Tony Tae-Hyoung Kim (A-SSCC, 2017)

An Automated System for Checking Lithography Friendliness of Standard Cells. - I-Lun Tseng; Yongfu Li 003; Valerio Perez; Vikas Tripathi; Zhao Chuan Lee; Yoong Seang Jonathan Ong (APCCAS, 2018)

Identifying Lithography Weak-Points of Standard Cells with Partial Pattern Matching. - Yongfu Li 003; I-Lun Tseng; Zhao Chuan Lee; Valerio Perez; Vikas Tripathi; Yoong Seang Jonathan Ong (ISVLSI, 2018)

In Design DFM Rule Scoring and Fixing Method using ICV. - Vikas Tripathi; Yongfu Li 003; Zhao Chuan Lee; I-Lun Tseng; Jason Khaw; Jonathan Ong (CoRR, 2018)

Advanced In-Design Auto-Fixing Flow for Cell Abutment Pattern Matching Weakpoints. - Yongfu Li 003; Valerio Perez; I-Lun Tseng; Zhao Chuan Lee; Vikas Tripathi; Jason Khaw; Yoong Seang Jonathan Ong (CoRR, 2018)

Creation and Fixing of Lithography Hotspots with Synopsys Tools. - I-Lun Tseng; Valerio Perez; Yongfu Li 003; Zhao Chuan Lee; Vikas Tripathi; Yoong Seang Jonathan Ong (CoRR, 2018)

Context-Aware DFM Rule Analysis and Scoring Using Machine Learning. - Vikas Tripathi; Valerio Perez; Yongfu Li 003; Zhao Chuan Lee; I-Lun Tseng; Jonathan Ong (CoRR, 2018)

A System for Standard Cell Routability Checking and Placement Routability Improvements. - I-Lun Tseng; Zhao Chuan Lee; Vikas Tripathi; Chun Ming Tommy Yip; Zhinan Chen; Jonathan Ong (APCCAS, 2019)

An 8T SRAM With On-Chip Dynamic Reliability Management and Two-Phase Write Operation in 28-nm FDSOI. - Zhao Chuan Lee; M. Sultan M. Siddiqui; Zhi-Hui Kong; Tony Tae-Hyoung Kim (IEEE J. Solid State Circuits, 2019)

Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation. - Achiranshu Garg; Zhao Chuan Lee; Lu Lu 013; Tony Tae-Hyoung Kim (Microelectron. J., 2019)

A 16-kb 9T Ultralow-Voltage SRAM With Column-Based Split Cell-VSS, Data-Aware Write-Assist, and Enhanced Read Sensing Margin in 28-nm FDSOI. - M. Sultan M. Siddiqui; Zhao Chuan Lee; Tony Tae-Hyoung Kim (IEEE Trans. Very Large Scale Integr. Syst., 2021)