Reduction of Test Power and Data Volume in BIST Scheme based on Scan Slice Overlapping. - Bin Zhou; Yizheng Ye; Xin-chun Wu; Zhao-lin Li (ISCAS, 2009)

A new low power test pattern generator using a variable-length ring counter. - Bin Zhou; Yizheng Ye; Zhao-lin Li; Xin-chun Wu; Rui Ke (ISQED, 2009)

A test set embedding approach based on twisted-ring counter with few seeds. - Bin Zhou; Yizheng Ye; Zhao-lin Li; Jianwei Zhang 006; Xin-chun Wu; Rui Ke (Integr., 2010)