TCSE: A Target Cell States Elimination Coding Strategy for Highly Reliable Data Storage Based on 3-D nand Flash Memory. - Debao Wei; Zhelong Piao; Hua Feng; Liyan Qiao; Cong Hu; Xiyuan Peng (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Edge Word-Line Reliability Problem in 3-D NAND Flash Memory: Observations, Analysis, and Solutions. - Debao Wei; Hua Feng; Ming Liu; Yu Song; Zhelong Piao; Cong Hu; Liyan Qiao (IEEE Trans. Very Large Scale Integr. Syst., 2023)

Exploiting Feature Layer for Read Reference Voltage Optimization on 3-D NAND Flash Memory. - Debao Wei; Zhelong Piao; Ming Liu; Yanlong Zeng; Hua Feng; Liyan Qiao; Xiyuan Peng (IEEE Trans. Consumer Electron., 2024)

Random Flip Bit Aware Reading for Improving High-Density 3-D NAND Flash Performance. - Hua Feng; Debao Wei; Shipeng Gu; Zhelong Piao; Yongchao Wang; Liyan Qiao (IEEE Trans. Circuits Syst. I Regul. Pap., 2024)

LVDE: A Lightweight Threshold Voltage Distribution Estimation Strategy for High-Performance 3-D Nand Flash Memory. - Zhelong Piao; Debao Wei; Huqi Xiang; Liyan Qiao; Xiyuan Peng (IEEE Trans. Circuits Syst. I Regul. Pap., 2025)

IDWA: A Importance-Driven Weight Allocation Algorithm for Low Write-Verify Ratio RRAM-Based In-Memory Computing. - Jingyuan Qu; Debao Wei; Dejun Zhang; Yanlong Zeng; Zhelong Piao; Liyan Qiao (IEEE Trans. Very Large Scale Integr. Syst., 2025)