Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs. - Zhen-Ying Hsieh; Mu-Chun Wang; Chih Chen; Jia-Min Shieh; Yu-Ting Lin; Shuang-Yuan Chen; Heng-Sheng Huang (Microelectron. Reliab., 2009)

Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process. - Mu-Chun Wang; Chuan-Hsi Liu; Kuo-Shu Huang; Zhen-Ying Hsieh; Shuang-Yuan Chen; Hsin-Chia Yang; Chii-Ruey Lin (Microelectron. Reliab., 2010)