TEPD: A Compound Timing Detection of Both Data-Transition and Path-Activation for Reliable In-Situ Timing Error Detection and Correction in 28nm CMOS. - Zhengguo Shen; Junyi Qian; Keran Li; Ziyu Li; Lishuo Deng; Weiwei Shan (A-SSCC, 2023)

A 28nm All-Digital, 1.92-7.32mV/LSB, 0.5-2GS/s sample rate, 0-latency Voltage Sensor with Dynamic PVT Calibration for Wide-range Adaptive Voltage Scaling. - Yuxuan Du; Haitao Ge; Zhuo Chen; Kaize Zhou; Zhengguo Shen; Weiwei Shan (CICC, 2023)

Beyond Eliminating Timing Margin: An Efficient and Reliable Negative Margin Timing Error Detection for Neural Network Accelerator Without Accuracy Loss. - Zhengguo Shen; Weiwei Shan; Yuxuan Du; Ziyu Li; Jun Yang 006 (IEEE J. Solid State Circuits, 2023)

An Adaptive Wide-Voltage-Range Droop Detection and Protection System Assisted with Timing Error Detection in 28nm CMOS. - Lishuo Deng; Zhengguo Shen; Zhuo Chen; Cai Li; Junyi Qian; Yuxuan Du; Kaize Zhou; Keran Li; Ruidong Li; Tuo Li; Xiaofeng Zou; Weiwei Shan (CICC, 2024)

DSC-TRCP: Dynamically Self-Calibrating Tunable Replica Critical Paths Based Timing Monitoring for Variation Resilient Circuits. - Yuxuan Du; Junyi Qian; Zhengguo Shen; Chengjun Wu; Weiwei Shan; Xi Wang 009 (IEEE J. Solid State Circuits, 2024)