Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications. - Cher Ming Tan; Zhenghao Gan; Wai Fung Ho; Sam Chen; Robert Liu (Microelectron. Reliab., 2005)

Feasibility study of the application of voltage contrast to printed circuit board. - Cher Ming Tan; Zhenghao Gan; Tai Chong Chai (Microelectron. Reliab., 2006)

Applications of finite element methods for reliability study of ULSI interconnections. - Cher Ming Tan; Wei Li; Zhenghao Gan (Microelectron. Reliab., 2012)

New insight on negative bias temperature instability degradation with drain bias of 28 nm High-K Metal Gate p-MOSFET devices. - Miao Liao; Zhenghao Gan (Microelectron. Reliab., 2014)

New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology. - Pengpeng Ren; Changze Liu; Sanping Wan; Jiayang Zhang; Zhuoqing Yu; Nie Liu; Yongsheng Sun; Runsheng Wang; Canhui Zhan; Zhenghao Gan; Waisum Wong; Yu Xia; et al. (IRPS, 2018)

FLAME-Based Multi-view 3D Face Reconstruction. - Wenzhuo Zheng; Junhao Zhao; Xiaohong Liu 001; Yongyang Pan; Zhenghao Gan; Haozhe Han; Ning Liu (CGI (4), 2023)

Multi-view 3D Face Reconstruction Based on Flame. - Wenzhuo Zheng; Junhao Zhao; Xiaohong Liu 001; Yongyang Pan; Zhenghao Gan; Haozhe Han; Ning Liu (CoRR, 2023)

Face2QR: A Unified Framework for Aesthetic, Face-Preserving, and Scannable QR Code Generation. - Xuehao Cui; Guangyang Wu; Zhenghao Gan; Guangtao Zhai; Xiaohong Liu 001 (NeurIPS, 2024)

Efficient Serving of LLM Applications with Probabilistic Demand Modeling. - Yifei Liu; Zuo Gan; Zhenghao Gan; Weiye Wang; Chen Chen 067; Yizhou Shan; Xusheng Chen; Zhenhua Han; Yifei Zhu 001; Shixuan Sun; Minyi Guo (CoRR, 2025)