A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies. - Zhenqiu Ning; Yuri Sneyders; Wim Vanderbauwhede; Renaud Gillon; Marnix Tack; Paul Raes (Microelectron. Reliab., 2001)

A novel electromagnetic interference resisting local interconnection network transmitter. - Zhengmin Zhang; Lin Zhang; Zhenqiu Ning; Xing Jin (IEICE Electron. Express, 2014)

A high electromagnetic immunity voltage regulator circuit applied in vehicle. - Zhengmin Zhang; Yingan Qin; Zhenqiu Ning; Xing Jin (IEICE Electron. Express, 2015)