Background-Adaptive Surface Defect Detection Neural Networks via Positive Samples. - Tongzhi Niu; Biao Chen; Zhenrong Wang; Ruoqi Zhang; Bin Li 026 (IECON, 2023)

Learning Trustworthy Model from Noisy Labels based on Rough Set for Surface Defect Detection. - Tongzhi Niu; Bin Li 026; Kai Li; Yufeng Lin; Yuwei Li; Weifeng Li; Zhenrong Wang (CoRR, 2023)

NAS-ASDet: An Adaptive Design Method for Surface Defect Detection Network using Neural Architecture Search. - Zhenrong Wang; Bin Li 026; Weifeng Li; Shuanlong Niu; Wang Miao; Tongzhi Niu (CoRR, 2023)

Selecting informative data for defect segmentation from imbalanced datasets via active learning. - Weifeng Li; Bin Li 026; Shuanlong Niu; Zhenrong Wang; Baohui Liu; Tongzhi Niu (Adv. Eng. Informatics, 2023)

Image Reconstruction Error-based Industrial Image Data Drift Detection. - Weifeng Li; Zhenrong Wang; Bin Li (IEEM, 2024)

An Automatic Design Method for Dynamic Detection Networks of Industrial Surface Defects. - Zhenrong Wang; Weifeng Li; Jinghao Xie; Bin Li (IEEM, 2024)

NAS-ASDet: An adaptive design method for surface defect detection network using neural architecture search. - Zhenrong Wang; Bin Li 026; Weifeng Li; Shuanlong Niu; Miao Wang; Tongzhi Niu (Adv. Eng. Informatics, 2024)

Learning trustworthy model from noisy labels based on rough set for surface defect detection. - Tongzhi Niu; Zhenrong Wang; Weifeng Li; Kai Li; Yuwei Li; Guiyin Xu; Bin Li 026 (Appl. Soft Comput., 2024)

A drift detection method for industrial images based on a defect segmentation model. - Weifeng Li; Bin Li 026; Zhenrong Wang; Chaochao Qiu; Shuanlong Niu; Xin Tan; Tongzhi Niu (Knowl. Based Syst., 2024)

A-Net: An A-Shape Lightweight Neural Network for Real-Time Surface Defect Segmentation. - Biao Chen; Tongzhi Niu; Wenyong Yu; Ruoqi Zhang; Zhenrong Wang; Bin Li 026 (IEEE Trans. Instrum. Meas., 2024)

End-to-End HOI Reconstruction Transformer with Graph-based Encoding. - Zhenrong Wang; Qi Zheng; Sihan Ma; Maosheng Ye; Yibing Zhan; Dongjiang Li (CVPR, 2025)