Multi-scale GAN with transformer for surface defect inspection of IC metal packages. - Kaiqiong Chen; Nian Cai; Zhenshuang Wu; Hao Xia; Shuai Zhou; Han Wang 017 (Expert Syst. Appl., 2023)

GAN-based statistical modeling with adaptive schemes for surface defect inspection of IC metal packages. - Zhenshuang Wu; Nian Cai; Kaiqiong Chen; Hao Xia; Shuai Zhou; Han Wang 017 (J. Intell. Manuf., 2024)