Layout dependence of total-ionizing-dose response in 65-nm bulk Si pMOSFET. - Zhexuan Ren; Xia An; Gensong Li; Xing Zhang 002; Ru Huang 001 (Sci. China Inf. Sci., 2021)

Single event transients induced by pulse laser in Ge pMOSFETs and its supply voltage dependence. - Jingyi Liu; Xia An; Gensong Li; Zhexuan Ren; Ming Li; Xing Zhang 002; Ru Huang 001 (Sci. China Inf. Sci., 2022)