Bitstream decoding and SEU-induced failure analysis in SRAM-based FPGAs. - Zhongming Wang; Zhibin Yao; Hongxia Guo; Min Lv (Sci. China Inf. Sci., 2012)

Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage. - Zujun Wang; Baoping He; Wuying Ma; Zhibin Yao; Shaoyan Huang; Minbo Liu; Jiangkun Sheng (J. Sensors, 2016)

Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods. - Yuanyuan Xue; Zujun Wang; Minbo Liu; Baoping He; Zhibin Yao; Jiangkun Sheng; Wuying Ma; Guantao Dong; Junshan Jin (Sci. China Inf. Sci., 2017)

Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects. - Yuanyuan Xue; Zujun Wang; Wei Chen 153; Minbo Liu; Baoping He; Zhibin Yao; Jiangkun Sheng; Wuying Ma; Guantao Dong; Junshan Jin (Sensors, 2017)

A two-dimensional Chebyshev wavelets approach for solving the Fokker-Planck equations of time and space fractional derivatives type with variable coefficients. - Jiaquan Xie; Zhibin Yao; Hailian Gui; Fuqiang Zhao; Dongyang Li (Appl. Math. Comput., 2018)

Modeling dark signal of CMOS image sensors irradiated by reactor neutron using Monte Carlo method. - Yuanyuan Xue; Zujun Wang; Wei Chen 153; Baoping He; Zhibin Yao; Minbo Liu; Jiangkun Sheng; Wuying Ma; Guantao Dong; Junshan Jin (Sci. China Inf. Sci., 2018)

Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors. - Zujun Wang; Yuanyuan Xue; Wei Chen 153; Rui Xu; Hao Ning; Baoping He; Zhibin Yao; Minbo Liu; Jiangkun Sheng; Wuying Ma; Guantao Dong (Sci. China Inf. Sci., 2019)

Using Hampel Identifier to Eliminate Profile-Isolated Outliers in Laser Vision Measurement. - Zhibin Yao; Jiaquan Xie; Yaqin Tian; Qingxue Huang (J. Sensors, 2019)