36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In. - Kunyang Liu; Zihan Fu; Gen Li; Hongliang Pu; Zhibo Guan; Xingyu Wang 002; Xinpeng Chen; Hirofumi Shinohara (ISSCC, 2021)