Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits. - Zhide Zeng; Jihua Chen; Hefeng Cao (Asian Test Symposium, 1999)

A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits. - Zhide Zeng; Jihua Chen; Pengxia Liu (Asian Test Symposium, 1999)

Development of a New High-Frequency B-Dot Probes to Detect Electromagnetic Characteristics of Helicon Wave Antenna in the Near Field. - Zhi Li 088; Lingfeng Lu; Lin Nie; Lei Chang; Zhide Zeng; Huaiqing Zhang (IEEE Trans. Instrum. Meas., 2024)