Evaluation of Management Information System Based on Fuzzy AHP and Multiple Matter Elements. - Zhigang Ji (PACCS, 2009)

Evaluate the Selection of Logistics Centre Location Using SVM Based on Principal Component Analysis. - Zhigang Ji; Meiye Zhang; Zhenguo Zhang (PACCS, 2009)

Research on Knowledge Management for Person in E-learning. - Zhigang Ji; Niugai Fang; Haiyan Yang (SSME, 2009)

The Application of RBF Neural Network on Construction Cost Forecasting. - Zhigang Ji; Yajing Li (WKDD, 2009)

The Research on Modeling Document Summarization for Audio-Based Knowledge Management. - Zhigang Ji (J. Softw., 2010)

EMD-Based Multi-Model Prediction for Network Traffic in Software-Defined Networks. - Longfei Dai; Wenguo Yang; Suixiang Gao; Yinben Xia; Mingming Zhu; Zhigang Ji (MASS, 2014)

Energy distribution of positive charges in high-k dielectric. - Sharifah Wan Muhamad Hatta; Zhigang Ji; Jianfu Zhang 001; Weidong Zhang 002; Norhayati Soin; Ben Kaczer; Stefan De Gendt; Guido Groeseneken (Microelectron. Reliab., 2014)

NBTI prediction and its induced time dependent variation. - Jianfu Zhang 001; Meng Duan; Zhigang Ji; Weidong Zhang 002 (ASICON, 2015)

ESD characterization of planar InGaAs devices. - Zhigang Ji; Dimitri Linten; Roman Boschke; Geert Hellings; S. H. Chen; AliReza Alian; D. Zhou; Yves Mols; Tsvetan Ivanov; Jacopo Franco; Ben Kaczer; X. Zhang; et al. (IRPS, 2015)

Non-Real-Time Network Traffic in Software-Defined Networking: A Link Bandwidth Prediction-Based Algorithm. - Longfei Dai; Wenguo Yang; Suixiang Gao; Yinben Xia; Mingming Zhu; Zhigang Ji (Comput. Inf. Sci., 2015)

Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. - Jianfu Zhang 001; Meng Duan; Zhigang Ji; Weidong Zhang 002 (ASICON, 2017)

3D Fabric: Differential Deceleration and Detour for Congestion Free Data Center Networks. - Haoyu Song 001; Zhigang Ji; Yali Zhang; Yinben Xia (SIGCOMM Posters and Demos, 2017)

As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction. - Jianfu Zhang 001; Zhigang Ji; Wei Dong Zhang 002 (Microelectron. Reliab., 2018)

An assessment of RTN-induced threshold voltage jitter. - Jianfu Zhang 001; Azrif Manut; Rui Gao 003; Mehzabeen Mehedi; Zhigang Ji; Weidong Zhang 002; John S. Marsland (ASICON, 2019)

Voltage step stress: a technique for reducing test time of device ageing. - Jian Fu Zhang 001; Zhigang Ji; Meng Duan; Wei Dong Zhang 002; Cezhou Zhao (ICICDT, 2019)

Design for reliability with the advanced integrated circuit (IC) technology: challenges and opportunities. - Zhigang Ji; Haibao Chen; Xiuyan Li (Sci. China Inf. Sci., 2019)

A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. - Rui Gao 003; Mehzabeen Mehedi; Haibao Chen; Xinsheng Wang; Jianfu Zhang 001; Xiaoling Lin; Zhiyuan He; Yiqiang Chen 002; Dengyun Lei; Yun Huang; Yunfei En; Zhigang Ji; et al. (IRPS, 2020)

"Shift and Match" (S...M) method for channel mobility correction in degraded MOSFETs. - Linglin Jing; Rui Gao 003; Zhigang Ji; Runsheng Wang (IRPS, 2020)

Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs. - Longda Zhou; Qingzhu Zhang; Hong Yang; Zhigang Ji; Zhaohao Zhang; Renren Xu; Huaxiang Yin; Wenwu Wang 006 (IRPS, 2020)

An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants. - Mehzabeen Mehedi; Kean Hong Tok; Jianfu Zhang 001; Zhigang Ji; Zengliang Ye; Weidong Zhang 002; John S. Marsland (IEEE Access, 2020)

Dual-Point Technique for Multi-Trap RTN Signal Extraction. - Xuepeng Zhan; Yifang Xi; Qianwen Wang; Weiqiang Zhang; Zhigang Ji; Jiezhi Chen (IEEE Access, 2020)

Real-time deep reinforcement learning based vehicle navigation. - Koh Song Sang; Bo Zhou 001; Hui Fang 003; Po Yang 001; Zaili Yang; Qiang Yang 004; Lin Guan; Zhigang Ji (Appl. Soft Comput., 2020)

An integrated method for extracting the statistical distribution of RTN time constants. - Mehzabeen Mehedi; Kean Hong Tok; Jian Fu Zhang 001; Zhigang Ji; Zengliang Ye; Weidong Zhang 002; John S. Marsland (ASICON, 2021)

Understanding Generated RTN as an Entropy Source for True Random Number Generators. - Zhigang Ji; Jianfu Zhang 001 (ICICDT, 2021)

Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs. - Hao Chang; Longda Zhou; Hong Yang; Zhigang Ji; Qianqian Liu; Eddy Simoen; Huaxiang Yin; Wenwu Wang 006 (IRPS, 2021)

A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs. - Longda Zhou; Zhaohao Zhang; Hong Yang; Zhigang Ji; Qianqian Liu; Qingzhu Zhang; Eddy Simoen; Huaxiang Yin; Jun Luo; Anyan Du; Chao Zhao; Wenwu Wang 006 (IRPS, 2021)

Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing. - Chunyang Liu; Pengpeng Ren; Bo Zhou 001; Jianfu Zhang 001; Hui Fang 003; Zhigang Ji (IEEE Access, 2021)

On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude. - Mehzabeen Mehedi; Kean Hong Tok; Zengliang Ye; Jianfu Zhang 001; Zhigang Ji; Weidong Zhang 002; John S. Marsland (IEEE Access, 2021)

Fast Video Facial Expression Recognition by a Deeply Tensor-Compressed LSTM Neural Network for Mobile Devices. - Peining Zhen; Hai-Bao Chen; Yuan Cheng; Zhigang Ji; Bin Liu; Hao Yu 001 (ACM Trans. Internet Things, 2021)

Towards a more efficient few-shot learning-based human gesture recognition via dynamic vision sensors. - Linglin Jing; Yifan Wang 008; Tailin Chen; Shirin Dora; Zhigang Ji; Hui Fang 003 (BMVC, 2022)

New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology. - Yong Liu; Pengpeng Ren; Da Wang; Longda Zhou; Zhigang Ji; Junhua Liu; Runsheng Wang; Ru Huang 001 (IRPS, 2022)

Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications. - Pengpeng Ren; Xinfa Zhang; Junhua Liu; Runsheng Wang; Zhigang Ji; Ru Huang 001 (IRPS, 2022)

Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies. - Da Wang; Yong Liu; Pengpeng Ren; Longda Zhou; Zhigang Ji; Junhua Liu; Runsheng Wang; Ru Huang 001 (IRPS, 2022)

Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors. - Xuepeng Zhan; Jiezhi Chen; Zhigang Ji (Sci. China Inf. Sci., 2022)

A Space-Time Neural Network for Analysis of Stress Evolution Under DC Current Stressing. - Tianshu Hou; Ngai Wong 001; Quan Chen 007; Zhigang Ji; Hai-Bao Chen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps. - Kean Hong Tok; Jian Fu Zhang 001; James Brown; Zhigang Ji; Weidong Zhang 002 (ASICON, 2023)

Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. - Zixuan Sun; Haoran Lu; Yongkang Xue; Wenpu Luo; Zirui Wang; Jiayang Zhang; Zhigang Ji; Runsheng Wang; Ru Huang 001 (IRPS, 2023)

Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM. - Yishan Wu; Puyang Cai; Zhiwei Liu; Pengpeng Ren; Zhigang Ji (IRPS, 2023)

Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation. - Longda Zhou; Jie Li; Zheng Qiao; Pengpeng Ren; Zixuan Sun; Jianping Wang; Blacksmith Wu; Zhigang Ji; Runsheng Wang; Kanyu Cao; Ru Huang 001 (IRPS, 2023)

ChameleMon: Shifting Measurement Attention as Network State Changes. - Kaicheng Yang 001; Yuhan Wu 001; Ruijie Miao; Tong Yang 003; Zirui Liu 002; Zicang Xu; Rui Qiu; Yikai Zhao 001; Hanglong Lv; Zhigang Ji; Gaogang Xie (SIGCOMM, 2023)

Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence. - Zuoyuan Dong; Zixuan Sun; Xin Yang; Xiaomei Li; Yongkang Xue; Chen Luo; Puyang Cai; Zirui Wang; Shuying Wang; Yewei Zhang; Chaolun Wang; Pengpeng Ren; et al. (VLSI Technology and Circuits, 2023)

A Pragmatic Model to Predict Future Device Aging. - James Brown; Kean Hong Tok; Rui Gao 003; Zhigang Ji; Weidong Zhang 002; John S. Marsland; Thomas Chiarella; Jacopo Franco; Ben Kaczer; Dimitri Linten; Jianfu Zhang 001 (IEEE Access, 2023)

Towards Accurate Oriented Object Detection in Aerial Images with Adaptive Multi-level Feature Fusion. - Peining Zhen; Shuqi Wang; Suming Zhang; Xiaotao Yan; Wei Wang; Zhigang Ji; Hai-Bao Chen (ACM Trans. Multim. Comput. Commun. Appl., 2023)

Efficient Aging-Aware Standard Cell Library Characterization Based on Sensitivity Analysis. - Xinfa Zhang; Zuodong Zhang; Yibo Lin; Zhigang Ji; Runsheng Wang; Ru Huang 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2023)

Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency. - Xiang Liu; Pengpeng Ren; Hai-Bao Chen; Zhigang Ji; Junhua Liu; Runsheng Wang; Jianfu Zhang 001; Ru Huang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

A Deep Learning Framework for Solving Stress-based Partial Differential Equations in Electromigration Analysis. - Tianshu Hou; Peining Zhen; Zhigang Ji; Hai-Bao Chen (ACM Trans. Design Autom. Electr. Syst., 2023)

Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing. - Tianshu Hou; Ngai Wong 001; Quan Chen 007; Zhigang Ji; Hai-Bao Chen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

CrossBind: Collaborative Cross-Modal Identification of Protein Nucleic-Acid-Binding Residues. - Linglin Jing; Sheng Xu; Yifan Wang 008; Yuzhe Zhou; Tao Shen; Zhigang Ji; Hui Fang 003; Zhen Li 026; Siqi Sun (AAAI, 2024)

Physics-Informed Learning for EPG-Based TDDB Assessment. - Dinghao Chen; Wenjie Zhu; Xiaoman Yang; Pengpeng Ren; Zhigang Ji; Hai-Bao Chen (ASPDAC, 2024)

Enforcing hard constraints in physics-informed learning for transient TSV electromigration analysis. - Xiaoman Yang; Hai-Bao Chen; Wenjie Zhu; Yuhan Zhang 005; Yongkang Xue; Pengpeng Ren; Runsheng Wang; Zhigang Ji; Ru Huang 001 (ICCAD, 2024)

Memory-facilitated Joint-space Shift Adaptation in Traffic Forecasting. - Ye Wei; He Haitao; Gerald Schaefer; Zhigang Ji; Yifan Wang 008; Hui Fang 003 (IJCNN, 2024)

Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs. - Zixuan Sun; Yongkang Xue; Haoran Lu; Pengpeng Ren; Zirui Wang; Zhigang Ji; Runsheng Wang; Ru Huang 001 (IRPS, 2024)

Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification. - Da Wang; Yongkang Xue; Yong Liu; Pengpeng Ren; Zixuan Sun; Zirui Wang; Yueyang Liu; Zhijun Cheng; Haiyang Yang; Xiangli Liu; Blacksmith Wu; Kanyu Cao; et al. (IRPS, 2024)

A Thermal Profile Prediction Methodology for Nanosheet Circuits Featuring Cross-Layer Thermal Coupling Effect. - Shuying Wang; Yewei Zhang; Yunjoong Kim; Pengpeng Ren; Zhigang Ji (IRPS, 2024)

Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED. - Shiyu Xia; Longda Zhou; Kewei Wang 008; Xiaobin Fan; Yongkang Xue; Qi Shan; Hannian Wang; Pengpeng Ren; Zhigang Ji; Ru Huang 001 (IRPS, 2024)

A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation. - Yu Xiao; Chenyang Zhang; Da Wang; Yongkang Xue; Pengpeng Ren; Zhigang Ji (IRPS, 2024)

Investigation of Positive Bias Temperature Instability in advanced FinFET nodes. - Yongkang Xue; Miaojia Yuan; Yu Li; Da Wang; Maokun Wu; Pengpeng Ren; Lining Zhang; Runsheng Wang; Zhigang Ji; Ru Huang 001 (IRPS, 2024)

Understanding the Physical Mechanism of RowPress at the Device-Level in Sub-20 nm DRAM. - Longda Zhou; Jie Li; Pengpeng Ren; Sheng Ye; Da Wang; Zheng Qiao; Zhigang Ji (IRPS, 2024)

A strong physical unclonable function with machine learning immunity for Internet of Things application. - Pengpeng Ren; Yongkang Xue; Linglin Jing; Lining Zhang; Runsheng Wang; Zhigang Ji (Sci. China Inf. Sci., 2024)

Infinite-LLM: Efficient LLM Service for Long Context with DistAttention and Distributed KVCache. - Bin Lin; Tao Peng; Chen Zhang; Minmin Sun; Lanbo Li; Hanyu Zhao; Wencong Xiao; Qi Xu; Xiafei Qiu; Shen Li; Zhigang Ji; Yong Li 020; et al. (CoRR, 2024)

A Memory-augmented Conditional Neural Process model for traffic prediction. - Ye Wei; He Haitao; Kunhao Yuan; Gerald Schaefer; Zhigang Ji; Hui Fang 003 (Knowl. Based Syst., 2024)

DRGA-Based Second-Order Block Arnoldi Method for Model Order Reduction of MIMO RCS Circuits. - Hai-Bao Chen; Xinjie Zhang; Wenjie Zhu; Jie Chen 005; Pengpeng Ren; Zhigang Ji; Junhua Liu; Runsheng Wang; Ru Huang 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2024)

Fast Aging-Aware Timing Analysis Framework With Temporal-Spatial Graph Neural Network. - Jinfeng Ye; Pengpeng Ren; Yongkang Xue; Hui Fang 003; Zhigang Ji (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2024)

High-Throughput Addressable Test Structure Design for Nano-Scaled CMOS Device Characterization. - Xiaolin Wang; Da Wang; Lei Guo; Pengpeng Ren; Zhigang Ji (IEEE Trans. Circuits Syst. II Express Briefs, 2024)

Multi-Level RTN with Certain Regularities in Oxide-RRAM: Experiments, Defect Dynamics and 3D Multi-Physics Modeling. - Dejiang Mu; Pan Liu; Zijian Zhou; Zifei Cai; Jian Zhang; Kanhao Xue; Zhigang Ji; Xiangshui Miao; Xingsheng Wang (IRPS, 2025)

DSTC: Dual-Side Sparse Tensor Core for DNNs Acceleration on Modern GPU Architectures. - Chen Zhang 001; Yang Wang 053; Zhiqiang Xie; Cong Guo 003; Yunxin Liu 001; Jingwen Leng; Zhigang Ji; Yuan Xie 001; Ru Huang 001 (IEEE Trans. Computers, 2025)

Physics-Informed Learning Based Multiphysics Simulation for Fast Transient TSV Electromigration Analysis. - Xiaoman Yang; Haibao Chen; Yuhan Zhang 005; Tianshu Hou; Pengpeng Ren; Runsheng Wang; Zhigang Ji; Ru Huang 001 (ACM Trans. Design Autom. Electr. Syst., 2025)

Fine-Grained Structured Sparse Computing for FPGA-Based AI Inference. - Chen Zhang 001; Shijie Cao; Guohao Dai; Chenbo Geng; Zhuliang Yao; Wencong Xiao; Yunxin Liu 001; Ming Wu 007; Lintao Zhang; Guangyu Sun 003; Zhigang Ji; Runsheng Wang; et al. (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)