A robust close-range photogrammetric system for industrial metrology. - Jian Xu; Zhong Ping Fang; Andrew A. Malcolm; Han Wang 001 (ICARCV, 2002)

Equipment design and process control of critical dimensions in lithography. - Yit Sung Ngo; Geng Yang; Andi Sudjana Putra; Kar Tien Ang; Arthur Tay; Zhong Ping Fang (ICCA, 2010)