Influence of Backside p-Region Width on the Overcurrent Reverse Recovery of High-voltage RFC Diodes. - Lihao Wang; Yu Wu 015; Yunpeng Jia; Yuanfu Zhao; Zhonghan Deng (EITCE, 2020)

Study on The Degradations Produced by Different P-base Diffusion Temperatures on SGT MOSFET With Approximate Threshold Voltage. - Xinyu Li; Yunpeng Jia; Xintian Zhou; Yuanfu Zhao; Xingyu Fang; Zhonghan Deng (EITCE, 2021)