A degradation modeling method based on artificial neural network supported Tweedie exponential dispersion process. - Zhongze He; Shaoping Wang; Di Liu 012 (Adv. Eng. Informatics, 2025)

A nonparametric degradation modeling method based on generalized stochastic process with B-spline function and Kolmogorov hypothesis test considering distribution uncertainty. - Zhongze He; Shaoping Wang; Di Liu 012 (Comput. Ind. Eng., 2025)

Physics-informed neural network supported wiener process for degradation modeling and reliability prediction. - Zhongze He; Shaoping Wang; Jian Shi; Di Liu 012; Xiaochuan Duan; Yaoxing Shang (Reliab. Eng. Syst. Saf., 2025)