DeepSEM-Net: Enhancing SEM defect analysis in semiconductor manufacturing with a dual-branch CNN-Transformer architecture. - Yibo Qiao; Zhouzhouzhou Mei; Yuening Luo; Yining Chen (Comput. Ind. Eng., 2024)

DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture. - Lichao Zeng; Zhouzhouzhou Mei; Zhongyu Shi; Yining Chen (ASP-DAC, 2025)

A novel joint segmentation approach for wafer surface defect classification based on blended network structure. - Zhouzhouzhou Mei; Yuening Luo; Yibo Qiao; Yining Chen (J. Intell. Manuf., 2025)

SCSNet: a novel transformer-CNN fusion architecture for enhanced segmentation and classification on high-resolution semiconductor micro-scale defects. - Yuening Luo; Zhouzhouzhou Mei; Yibo Qiao; Yining Chen (Appl. Intell., 2025)