On Generating Pseudo-Functional Delay Fault Tests for Scan Designs. - Zhuo Zhang 008; Sudhakar M. Reddy; Irith Pomeranz (DFT, 2005)

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs. - Santiago Remersaro; Xijiang Lin; Zhuo Zhang 008; Sudhakar M. Reddy; Irith Pomeranz; Janusz Rajski (ITC, 2006)

Scan Tests with Multiple Fault Activation Cycles for Delay Faults. - Zhuo Zhang 008; Sudhakar M. Reddy; Irith Pomeranz; Xijiang Lin; Janusz Rajski (VTS, 2006)

Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes. - Zhuo Zhang 008; Sudhakar M. Reddy; Irith Pomeranz (ASP-DAC, 2007)

Enhancing delay fault coverage through low-power segmented scan. - Zhuo Zhang 008; Sudhakar M. Reddy; Irith Pomeranz; Janusz Rajski; Bashir M. Al-Hashimi (IET Comput. Digit. Tech., 2007)

On achieving minimal size test sets for scan designs. - Sudhakar M. Reddy; Zhuo Zhang 008 (it Inf. Technol., 2014)