Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator. - Shaofeng Guo; Runsheng Wang; Zhuoqing Yu; Peng Hao; Pengpeng Ren; Yangyuan Wang; Siyu Liao; Chunyi Huang; Tianlei Guo; Alvin Chen; Jushan Xie; Ru Huang 001 (ICCAD, 2017)

New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology. - Pengpeng Ren; Changze Liu; Sanping Wan; Jiayang Zhang; Zhuoqing Yu; Nie Liu; Yongsheng Sun; Runsheng Wang; Canhui Zhan; Zhenghao Gan; Waisum Wong; Yu Xia; et al. (IRPS, 2018)