Wavelet decomposition and reconstruction-based INL method for testing high-precision ADC. - Xiaohui Guo; Xu Yan; Shimin Ma; Xinyi Zhang; Ziaho Yan; Anqi Zhang; Kai Xu; Liangping Hua; Yan Du; Hao Wang; Yuxin Shu; Weiqiang Hong; et al. (Microelectron. J., 2023)