A single event upset tolerant latch design. - Haibin Wang; Xixi Dai; Yangsheng Wang; Issam Nofal; Li Cai; Zicai Shen; Wanxiu Sun; Jinshun Bi; Bo Li 051; Gang Guo; Li Chen 001; Sang H. Baeg (Microelectron. Reliab., 2018)

A Layout-Based Rad-Hard DICE Flip-Flop Design. - Haibin Wang; Xixi Dai; Younis Mohammed Younis Ibrahim; Hongwen Sun; Issam Nofal; Li Cai; Gang Guo; Zicai Shen; Li Chen 001 (J. Electron. Test., 2019)