MIV Fault Modeling Method Based on Finite Element Analysis. - Ziwen Xiao; Zhiming Yang 001; Yang Yu 015 (ICTA, 2021)

An ILD Void Detection Method for Monolithic 3-D ICs Based on Switched Capacitors. - Ziwen Xiao; Zhiming Yang 001; Yang Yu 015 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

An MIV Test Method Using High-Precision Voltage Dividers. - Ziwen Xiao; Zhiming Yang 001; Yang Yu 015 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2024)

An MIV Fault Diagnosis Method Based on Signal Transmission Performance Analysis. - Ziwen Xiao; Lifu Du; Zhiming Yang 001; Cuiyu Liu; Yang Yu 015 (IEEE Trans. Very Large Scale Integr. Syst., 2025)