A Calibration-Free 15-level/Cell eDRAM Computing-in-Memory Macro with 3T1C Current-Programmed Dynamic-Cascoded MLC achieving 233-to-304-TOPS/W 4b MAC. - Jiahao Song; Xiyuan Tang; Haoyang Luo; Haoyi Zhang; Xin Qiao; Zixuan Sun; Xiangxing Yang; Yuan Wang 001; Runsheng Wang; Ru Huang 001 (CICC, 2023)

Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. - Zixuan Sun; Haoran Lu; Yongkang Xue; Wenpu Luo; Zirui Wang; Jiayang Zhang; Zhigang Ji; Runsheng Wang; Ru Huang 001 (IRPS, 2023)

Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation. - Longda Zhou; Jie Li; Zheng Qiao; Pengpeng Ren; Zixuan Sun; Jianping Wang; Blacksmith Wu; Zhigang Ji; Runsheng Wang; Kanyu Cao; Ru Huang 001 (IRPS, 2023)

Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence. - Zuoyuan Dong; Zixuan Sun; Xin Yang; Xiaomei Li; Yongkang Xue; Chen Luo; Puyang Cai; Zirui Wang; Shuying Wang; Yewei Zhang; Chaolun Wang; Pengpeng Ren; et al. (VLSI Technology and Circuits, 2023)

Segment Anything Model Guided Semantic Knowledge Learning For Remote Sensing Change Detection. - Zixuan Sun; Huihui Song; Kaihua Zhang 001; Gang Dong; Lingyan Liang; Yaqian Zhao (ICASSP, 2024)

Glance, Focus and Refinement Network for Remote Sensing Change Detection. - Hao Zhang; Zixuan Sun; Yuhui Zheng; Kaihua Zhang 001; Gang Dong; Lingyan Liang; Yaqian Zhao (ICASSP, 2024)

Accelerating Device-Circuit Self-Heating Simulations with Dynamic Time Evolution for GAAFET. - Sihao Chen; Yu Li; Baokang Peng; Zixuan Sun; Lining Zhang; Runsheng Wang; Ru Huang 001 (IRPS, 2024)

Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs. - Zixuan Sun; Yongkang Xue; Haoran Lu; Pengpeng Ren; Zirui Wang; Zhigang Ji; Runsheng Wang; Ru Huang 001 (IRPS, 2024)

New Insights into the Random Telegraph Noise (RTN) in FinFETs at Cryogenic Temperature. - Zirui Wang; Haoran Wang; Yuxiao Wang; Zixuan Sun; Lang Zeng; Runsheng Wang; Ru Huang 001 (IRPS, 2024)

Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification. - Da Wang; Yongkang Xue; Yong Liu; Pengpeng Ren; Zixuan Sun; Zirui Wang; Yueyang Liu; Zhijun Cheng; Haiyang Yang; Xiangli Liu; Blacksmith Wu; Kanyu Cao; et al. (IRPS, 2024)

Deep Learning-Assisted Trap Extraction Method from Noise Power Spectral Density for MOSFETs. - Jinghan Xu; Zheng Zhou; Mengqi Fan; Zixuan Sun; Shuhan Wang; Zili Tang; Fei Liu; Xiaoyan Liu (IRPS, 2024)

OS3Flow: Optical and SAR Image Registration Using Symmetry-Guided Semi-Dense Optical Flow. - Zixuan Sun; Shuaifeng Zhi; Kai Huo; Xuecong Liu; Weidong Jiang; Yongxiang Liu (IEEE Geosci. Remote. Sens. Lett., 2024)

A 4-bit Calibration-Free Computing-In-Memory Macro With 3T1C Current-Programed Dynamic-Cascode Multi-Level-Cell eDRAM. - Jiahao Song; Xiyuan Tang; Haoyang Luo; Haoyi Zhang; Xin Qiao; Zixuan Sun; Xiangxing Yang; Zihan Wu 005; Yuan Wang 001; Runsheng Wang; Ru Huang 001 (IEEE J. Solid State Circuits, 2024)

New Insights into TDDB in FinFET Based on Strain Analysis at the Atomistic Scale. - Zuoyuan Dong; Zixuan Sun; Lan Li; Zirui Wang; Changqing Ye; Yu Yao; Jialu Huang; Xiaomei Li; Xing Wu; Runsheng Wang (IRPS, 2025)