A practical perspective on reducing ASIC NTFs. - Zoe Conroy; Geoff Richmond; Xinli Gu; Bill Eklow (ITC, 2005)

Are the IC guys helping or hindering board test? - Zoe Conroy (ITC, 2012)

Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. - Zoe Conroy; James J. Grealish; Harrison Miles; Anthony J. Suto; Alfred L. Crouch; Skip Meyers (ITC, 2012)

BA-BIST: Board test from inside the IC out. - Zoe Conroy; Alfred L. Crouch (ITC, 2013)

An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs. - Mehdi Sadi; Zoe Conroy; Bill Eklow; Matthias Kamm; Nematollah Bidokhti; Mark Mohammad Tehranipoor (ATS, 2014)

Board security enhancement using new locking SIB-based architectures. - Jennifer Dworak; Zoe Conroy; Alfred L. Crouch; John C. Potter (ITC, 2014)

Board manufacturing test correlation to IC manufacturing test. - C. Glenn Shirley; W. Robert Daasch; Phil Nigh; Zoe Conroy (ITC, 2014)

An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing. - Po-Fan Hou; Yi-Tsung Lin; Jiun-Lang Huang; Ann Shih; Zoe F. Conroy (ATS, 2016)