Characterization method for thermal interface materials imitating an in-situ environment. - András Vass-Várnai; Zoltán Sárkány; Márta Rencz (Microelectron. J., 2012)

Impact of nonlinearities on electronic device transient thermal responses. - Marcin Janicki; Zoltán Sárkány; Andrzej Napieralski (Microelectron. J., 2014)