Data Mining using Genetic Programming for Construction of a Semiconductor Manufacturing Yield Rate Prediction System. - Te-Sheng Li; Cheng-Lung Huang; Zong-Yuan Wu (J. Intell. Manuf., 2006)

Fuzzing Command-line Interface by Edge Coverage Guided Combinatorial Testing and Input Clustering. - Han-Lin Lu; Zong-Yuan Wu; Chien-Hsing Wu; Guan-Zhong Wang; Shih-Kun Huang (QRS, 2024)