Wafer Map Defect Recognition Based on Deep Transfer Learning. - Zongli Shen; Jianbo Yu (IEEM, 2019)

Deep transfer Wasserstein adversarial network for wafer map defect recognition. - Jianbo Yu; Shijin Li; Zongli Shen; Shijin Wang 002; Changhui Liu; Qingfeng Li 004 (Comput. Ind. Eng., 2021)

Wafer map defect recognition based on deep transfer learning-based densely connected convolutional network and deep forest. - Jianbo Yu; Zongli Shen; Shijin Wang 002 (Eng. Appl. Artif. Intell., 2021)

Joint Feature and Label Adversarial Network for Wafer Map Defect Recognition. - Jianbo Yu; Zongli Shen; Xiaoyun Zheng (IEEE Trans Autom. Sci. Eng., 2021)