Experimental validation of a thermal modelling method dedicated to multichip power modules in operating conditions. - S. Carubelli; Zoubir Khatir (Microelectron. J., 2003)

Boundary element analysis of thermal fatigue effects on high power IGBT modules. - Zoubir Khatir; Stéphane Lefebvre (Microelectron. Reliab., 2004)

Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling. - Laurent Dupont 002; Zoubir Khatir; Stéphane Lefebvre; S. Bontemps (Microelectron. Reliab., 2006)

Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditions. - M. Bouarroudj; Zoubir Khatir; Jean-Pierre Ousten; F. Badel; Laurent Dupont 002; Stéphane Lefebvre (Microelectron. Reliab., 2007)

Failure modes on low voltage power MOSFETs under high temperature application. - Laurent Dupont 002; Stéphane Lefebvre; M. Bouaroudj; Zoubir Khatir; Jean-Claude Faugières (Microelectron. Reliab., 2007)

Experimental and numerical investigations on delayed short-circuit failure mode of single chip IGBT devices. - Zoubir Khatir; Stéphane Lefebvre; F. Saint-Eve (Microelectron. Reliab., 2007)

Estimation of SiC JFET temperature during short-circuit operations. - Mounira Berkani; Stéphane Lefebvre; Narjes Boughrara; Zoubir Khatir; Jean-Claude Faugières; Peter Friedrichs; Ali Haddouche (Microelectron. Reliab., 2009)

Characterisation of power modules ceramic substrates for reliability aspects. - S. Pietranico; S. Pommier; Stéphane Lefebvre; Zoubir Khatir; S. Bontemps (Microelectron. Reliab., 2009)

Ageing of SiC JFET transistors under repetitive current limitation conditions. - M. Bouarroudj-Berkani; D. Othman; Stéphane Lefebvre; S. Moumen; Zoubir Khatir; T. Ben Sallah (Microelectron. Reliab., 2010)

Investigations on junction temperature estimation based on junction voltage measurements. - Zoubir Khatir; Laurent Dupont 002; Ali Ibrahim (Microelectron. Reliab., 2010)

Investigations of thermal interfaces aging under thermal cycling conditions for power electronics applications. - Jean-Pierre Ousten; Zoubir Khatir (Microelectron. Reliab., 2011)

Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling. - Vanessa Smet; François Forest; Jean-Jacques Huselstein; Frédéric Richardeau; Zoubir Khatir; Stéphane Lefebvre; Mounira Berkani (IEEE Trans. Ind. Electron., 2011)

Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application. - D. Othman; M. Bouarroudj-Berkani; Stéphane Lefebvre; Ali Ibrahim; Zoubir Khatir; A. Bouzourene (Microelectron. Reliab., 2012)

Distributed electro-thermal model of IGBT chip - Application to top-metal ageing effects in short circuit conditions. - Jeff Moussodji; Thierry Kociniewski; Zoubir Khatir (Microelectron. Reliab., 2013)

Robustness of 1.2 kV SiC MOSFET devices. - D. Othman; Stéphane Lefebvre; Mounira Berkani; Zoubir Khatir; Ali Ibrahim; A. Bouzourene (Microelectron. Reliab., 2013)

Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications. - Gilles Rostaing; Mounira Berkani; D. Mechouche; Denis Labrousse; Stéphane Lefebvre; Zoubir Khatir; Philippe Dupuy (Microelectron. Reliab., 2013)

μ-Raman spectroscopy for stress analysis in high power silicon devices. - Thierry Kociniewski; Jeff Moussodji; Zoubir Khatir (Microelectron. Reliab., 2014)

Solder void position and size effects on electro thermal behaviour of MOSFET transistors in forward bias conditions. - Son-Ha Tran; Laurent Dupont 002; Zoubir Khatir (Microelectron. Reliab., 2014)

Part-load control stategy of a 20kW SiC power converter for embedded PEMFC multi-stack architectures. - Abdelfatah Kolli; Alexandre De Bernardinis; Zoubir Khatir; Arnaud Gaillard; Olivier Bethoux; Daniel Hissel (IECON, 2015)

Mechanical and thermal stresses characterization maps on cross-sections of forward biased electronic power devices. - Thierry Kociniewski; Zoubir Khatir (IRPS, 2015)

Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions. - Thierry Kociniewski; Jeff Moussodji; Zoubir Khatir (Microelectron. Reliab., 2015)

Energy management of a battery-flywheel storage system used for regenerative braking recuperation of an Electric Vehicle. - Khaled Itani; Alexandre De Bernardinis; Zoubir Khatir; Ahmad Jammal (IECON, 2016)

Control strategy for extreme conditions regenerative braking of a hybrid energy storage system for an electric vehicle. - Khaled Itani; Alexandre De Bernardinis; Zoubir Khatir; Ahmad Jammal; Mohamad Oueidat (INDIN, 2016)

Power cycling issues and challenges of SiC-MOSFET power modules in high temperature conditions. - Ali Ibrahim; Jean-Pierre Ousten; Richard Lallemand; Zoubir Khatir (Microelectron. Reliab., 2016)

Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling. - Nausicaa Dornic; Ali Ibrahim; Zoubir Khatir; Son-Ha Tran; Jean-Pierre Ousten; Jeffrey Ewanchuk; Stefan Mollov (Microelectron. Reliab., 2018)

Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices. - Malika Elharizi; Fadi Zaki; Ali Ibrahim; Zoubir Khatir; Jean-Pierre Ousten (Microelectron. Reliab., 2018)