A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis. - Aiwu Ruan; Shi Kang; Yu Wang; Xiao Han; Zujian Zhu; Yongbo Liao; Peng Li (Microelectron. Reliab., 2013)

A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs. - Aiwu Ruan; Bairui Jie; Li Wan; Junhao Yang; Chuanyin Xiang; Zujian Zhu; Yu Wang (Microelectron. Reliab., 2014)