Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage. - Zujun Wang; Baoping He; Wuying Ma; Zhibin Yao; Shaoyan Huang; Minbo Liu; Jiangkun Sheng (J. Sensors, 2016)

Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods. - Yuanyuan Xue; Zujun Wang; Minbo Liu; Baoping He; Zhibin Yao; Jiangkun Sheng; Wuying Ma; Guantao Dong; Junshan Jin (Sci. China Inf. Sci., 2017)

Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects. - Yuanyuan Xue; Zujun Wang; Wei Chen 153; Minbo Liu; Baoping He; Zhibin Yao; Jiangkun Sheng; Wuying Ma; Guantao Dong; Junshan Jin (Sensors, 2017)

Modeling dark signal of CMOS image sensors irradiated by reactor neutron using Monte Carlo method. - Yuanyuan Xue; Zujun Wang; Wei Chen 153; Baoping He; Zhibin Yao; Minbo Liu; Jiangkun Sheng; Wuying Ma; Guantao Dong; Junshan Jin (Sci. China Inf. Sci., 2018)

Single-event multiple transients in guard-ring hardened inverter chains of different layout designs. - Wen Zhao; Chaohui He; Wei Chen; Rongmei Chen; Peitian Cong; Fengqi Zhang; Zujun Wang; Chen Shen; Lisang Zheng; Xiaoqiang Guo; Lili Ding (Microelectron. Reliab., 2018)

Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors. - Zujun Wang; Yuanyuan Xue; Wei Chen 153; Rui Xu; Hao Ning; Baoping He; Zhibin Yao; Minbo Liu; Jiangkun Sheng; Wuying Ma; Guantao Dong (Sci. China Inf. Sci., 2019)

Impact of thermal baking before radiation on the total dose response of bipolar device. - Wuying Ma; Xiaoping Ouyang 001; Hongxia Guo; Pei Li; Baoping He; Zujun Wang; Shilong Gou; Yuanyuan Xue (Microelectron. J., 2023)

Improving Radiation Reliability of SRAM-Based Physical Unclonable Function With Self-Healing and Pre-Irradiation Masking Techniques. - Zhuojun Chen; Wenhao Yang; Jinghang Chen; Zujun Wang; Ding Ding 003 (IEEE Trans. Very Large Scale Integr. Syst., 2024)

Synergistic Radiation Effects in PPD CMOS Image Sensors Induced by Neutron Displacement Damage and Gamma Ionization Damage. - Zujun Wang; Yuanyuan Xue; Ning Tang; Gang Huang; Xu Nie; Shan-Kun Lai; Baoping He; Wuying Ma; Jiangkun Sheng; Shilong Gou (Sensors, 2024)