HZO Scaling and Fatigue Recovery in FeFET with Low Voltage Operation: Evidence of Transition from Interface Degradation to Ferroelectric Fatigue. - Zuocheng Cai; Kasidit Toprasertpong; Mitsuru Takenaka; Shinichi Takagi (VLSI Technology and Circuits, 2023)

Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited). - Kasidit Toprasertpong; Eishin Nako; Shin-Yi Min; Zuocheng Cai; Seong-Kun Cho; Rikuo Suzuki; Ryosho Nakane; Mitsuru Takenaka; Shinichi Takagi (IRPS, 2024)