Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET. - Miaomiao Wang 006; Zuoguang Liu; Tenko Yamashita; James H. Stathis; Chia-Yu Chen (IRPS, 2015)

Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation. - Robert L. Bruce; Syed Ghazi Sarwat; Irem Boybat; Cheng-Wei Cheng; Wanki Kim; S. R. Nandakumar; Charles Mackin; Timothy Philip; Zuoguang Liu; Kevin Brew; Nanbo Gong; Injo Ok; et al. (IRPS, 2021)

Impact of Phase-Change Memory Flicker Noise and Weight Drift on Analog Hardware Inference for Large-Scale Deep Learning Networks. - Jin-Ping Han; Malte J. Rasch; Zuoguang Liu; Paul Solomon; Kevin Brew; Kangguo Cheng; Injo Ok; Victor Chan; Michael Longstreet; Wanki Kim; Robert L. Bruce; Cheng-Wei Cheng; et al. (Adv. Intell. Syst., 2022)